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KMID : 0385520010140060486
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Analytical Science & Technology
2001 Volume.14 No. 6 p.486 ~ p.493
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Effect of Surface Charging on the SIMS Depth Profile of Bismuth Titanate Thin Film
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김재남/Kim JN
이상업/권혁대/신광수/전웅/박병옥/조상희/Lee SU/Kwun HD/Shin KS/Chon U/Park BO/Cho SH
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Abstract
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KEYWORD
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